Appendix A
Test Results Definitions
DS0 DDS results
162
CT-650 Command-Line Reference Guide
Release 9.4
Time
The following fields appear in the Time category of the DS0 DDS test
results screens.
Pattern
Loss Sec-
onds
Number of seconds during which pattern synchroniza-
tion was lost since initial pattern synchronization.
Pattern
Slips
Total number of pattern slips since the beginning of the
test. When a slip is detected, the CT-650 automatically
resynchronizes to the received pattern. However, pat-
tern bit errors are not suppressed during this process.
Pattern slips are available only when using pseudo-
random patterns.
Field
Description
Field
Description
Time
Current time in hours, minutes, and seconds.
Date
Current day and month.
Time Left
Time remaining for a timed test in hours, minutes, and
seconds.
N/A
appears for tests with continuous
length.
Elapsed
Time
Elapsed time since the test started.
Test Length
Length of test for a timed test, in hours and minutes.
Summary of Contents for CT-650
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