26
7
SCANS
■
Programmed scan operation
q
Select VFO mode with [V/M].
w
Select the desired operating mode.
• The operating mode can also be changed while scan-
ning.
e
Set [RF/SQL] open or closed.
• See previous page for scan condition.
• If the [RF/SQL] control function is set as RF control, the
squelch always opens. See pgs. 14, 30 for details.
r
Push [SCAN] to start the programmed scan.
• “SCAN” appears while scanning.
t
When the scan detects a signal, the scan stops,
pauses or ignores it depending on the resume set-
ting and the squelch condition.
y
To cancel the scan, push [SCAN].
If the same frequencies are programmed into the
scan edge memory channel P1 and P2, pro-
grammed scan does not start.
USB
R X
S1
3
5
7
9
20
40
60dB
AGC
ANT 1
SCAN
V F O
■
Memory/select memory scan operation
q
Select memory mode with [V/M].
w
Select the desired operating mode.
• The operating mode can also be changed while scan-
ning.
e
Set [RF/SQL] open or closed.
• See previous page for scan condition.
• If the [RF/SQL] control function is set as RF control, the
squelch always opens. See pgs. 14, 30 for details.
r
Push [SCAN] to start the memory/select memory
scan.
• “SCAN” appears while scanning.
t
Push [SEL] to toggle between memory scan and
select memory scan.
y
When the scan detects a signal, the scan stops,
pauses or ignores it depending on the resume set-
ting and the squelch condition.
u
To cancel the scan, push [SCAN].
2 or more memory channels must be programmed
for memory scan to start.
USB
R X
S1
3
5
7
9
20
40
60dB
AGC
ANT
MEMO
1
SCAN
S
■
Setting select memory channels
q
Select memory mode with [V/M].
w
Select the desired memory channel to set as se-
lect memory channel.
e
Push [SEL] to set the memory channel as a select
memory or not.
• “S” appears for select memory channels.
r
Repeat steps
w
to
e
to program another memory
channel as a select memory channel, if desired.
USB
R X
S1
3
5
7
9
20
40
60dB
AGC
ANT
MEMO
1
S
“S” appears for the select channel.
