Model
General Information
Table
Specifications
DISPLAY:
Signature: Four-digit hexadecimal.
Characters
GATE, UNSTABLE SIGNATURE indicators: Panel Lights. Stretching: 100
Probe-tip indicator: Light indicates high, low, bad-level, and pulsing states.
Minimum pulsewidth:
Stretching:
PROBABILITY OF CLASSIFYING CORRECT DATA STREAM AS CORRECT: 100%.
PROBABILITY OF CLASSIFYING FAULTY DATA STREAM AS FAULTY: 99.998%.
MINIMUM GATE LENGTH: One clock cycle.
MINIMUM
BETWEEN GATES (from last STOP to next START): One clock cycle.
DATA PROBE:
lnput Impedance: 50
to 1.4 Volt, nominal. Shunted by
nominal.
Threshold: Logic one:
Volt
Logic zero:
Volt,
Setup Time: 15 nanoseconds, with
volt over-drive. (Data required to be valid at least
15 nanoseconds before selected clock edge.)
nanoseconds. (Data required to be held until occurrence of selected clock edge.)
GATING INPUT LINES:
START, STOP, CLOCK inputs:
Impedance: 50
to 1.4 volt, nominal. Shunted by
7
nominal.
Threshold: 1.4 volt k.6 (.l
volt hysteresis, typical).
START, STOP inputs:
Setup Time: 25 nanoseconds. (START, STOP to be valid at least 25 nanoseconds before
selected clock edge.)
Zero nanoseconds (START, STOP to be held until occurrence of selected clock edge).
CLOCK INPUT:
clock frequency: 10 MHz.
Minimum Clock Time in High or Low State: 50 nanoseconds.
VOLTAGE OVERLOAD PROTECTION: All inputs
volts continuous.
k 250 volts intermittent.
250 volts ac for 1 minute.
OPERATING ENVIRONMENT:
Temperature:
Relative Humidity: 95% at
Altitude:
POWER REQUIREMENTS:
Option
ac line,
Hz
Option
ac line,
Hz
Option
220V ac line,
48-66 Hz
Option
ac line,
48-66 Hz
WEIGHT: Net: 2.5 kg, 5.5
Shipping: 7.7 kg, 17
DIMENSIONS:
90
mm high x 215 mm wide x 300 mm deep
in. x
in. x 12 in.)
Dimensions exclude tilt bale, probes, and pouch.
1-15. DESCRIPTION O F
SIGNATURE ANALYZER
1-16.
The
HP Model
Signature Analyzer is a test instrument for troubleshooting com-
plex electronic logic circuits.
It
uses the signature analysis technique of troubleshooting.
1-17. Signature Analysis
1-18.
Signature analysis is a method of troubleshooting complex electronic logic circuits to
the individual component level. To use signature analysis with the
the unit to be tested
must have certain characteristics included with the original design. Typically a logic product
Summary of Contents for 5004A
Page 1: ......
Page 9: ......
Page 18: ......
Page 20: ......
Page 22: ......
Page 24: ......
Page 25: ......
Page 29: ......
Page 30: ......
Page 31: ......
Page 33: ......
Page 34: ......
Page 44: ......
Page 55: ......
Page 57: ......
Page 58: ......
Page 61: ......
Page 67: ......
Page 68: ......
Page 69: ......
Page 70: ......
Page 71: ......
Page 72: ......
Page 73: ......
Page 74: ......