Änderungen vorbehalten / Subject to change without notice
5
Specifications
Test principle
Display of component signatures on
an oscilloscope in X-Y mode.
Two-point testing.
Test objects
Semiconductor components of all kinds
(except power electronics),
Resistors (up to approx. 5 k
Ω
),
Capacitors (10nF- 100 µF),
LF ferrite-core inductors.
Test inputs
Pair of 4-min jacks (red and black)
for 2 test leads (included).
The black banana jack is grounded !
Two 3-point transistor sockets
(any combination of 2 contacts may be
selected for testing).
Test frequency
Sine-wave 50Hz
Test voltage
No-load voltage approx. 8.2V
eff
Test current
Switchable in 3 steps:
Max. approx. 200mA
eff
Med. approx. 50mA
eff
Min. approx, 5mA
eff
(if test leads are short-circuited).
Oscilloscope connections
Connection by means of 2 BNC jacks on the
side of the unit (grounded by way of power cord).
X output (voltage) for horizontal deflection.
Y output (current) for vertical deflection.
Power requirements
115V or 230V ± 10%. (internel selectable)
Line frequency 50-60 Hz.
Power consumption: max. 6.5 watts.
Built-in oveicurrent protection.
LED pilot lamp indicates operation.
Tested at: 3kV 50Hz.
Limited short-circuit protection (max. 5 min.)
Power cord with grounding (3-prong) plug,
length: approx. 1,6 m.
Enclosure
Made of non-conductive polystyrene.
Dimensions: 137mm x 80mm x 52 mm (L x W x H)
Total weight: approx. 600g
Component Tester HZ65
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Test of semiconductors
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Test of discrete components
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Rugged and compact
In conjunction with an oscilloscope, the
component tester HZ65 can be used to test
semiconductor components, resistors,
capacitors and inductors not only out-of-
circuit, but also often without desoldering
them from circuit boards. Within certain
limits, testing of integrated circuitry is also
possible. Transistors can be plugged into
two 3-point sockets; any combination of 2
contacts may be selected for testing.
This simplifies testing of different internal
transistor paths (base-emitter, emitter-
collector, base-collector). Components with
larger-diameter leads and ICs are connected
to the 2 jacks on the side of the HZ65 using
2 test cables. The direction of current flow
through the tested component or IC can be
reversed. The HZ65 is particularly indi-
spensable for repairs of electronic devices,
providing good-bad information within
seconds. This also allows quick comparison
of the unit under test with a known good
component or network.
Accessories supplied:
Two test cables (red and black)
with probes and banana plugs (HZ56)
Optional accessories:
BNC cable HZ33, HZ34
