Fujitsu MPE3043AE, Product Manual

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C141-E093-01EN 5 - 49
Table 5.8 Features Register values (subcommands) and functions (1/2)
Features Resister Function
X’D0’ SMART Read Attribute Values:
A device that received this subcommand asserts the BSY bit and saves all the
updated attribute values. The device then clears the BSY bit and transfers 512-
byte attribute value information to the host.
* For infomation about the format of the attribute value information, see Table
5.9.
X’D1’ SMART Read Attribute Thresholds:
This subcommand is used to transfer 512-byte insurance failure threshold value
data to the host.
* For information about the format of the insurance failure threshold value data,
see Table 5.10.
X’D2’ SMART Enable-Disable Attribute AutoSave:
This subcommand is used to enable (SC register
≠
00h) or disable (SC register =
00h) the setting of the automatic saving feature for the device attribute data. The
setting is maintained every time the device is turned off and then on. When the
automatic saving feature is enabled, the attribute values are saved before the
device enters the power saving mode. However, if the failure prediction feature
is disabled, the attribute values are not automatically saved.
When the device receives this subcommand, it asserts the BSY bit, enables or
disables the automatic saving feature, then clears the BSY bit.
X’D3’ SMART Save Attribute Values:
When the device receives this subcommand, it asserts the BSY bit, saves device
attribute value data, then clears the BSY bit.
X’D4’ SMART Executive Off-line Immediate:
A device which receives this command asserts the BSY bit, then starts collecting
the off-line data specified in the SN register, or stops.
In the off-line mode, after BSY is cleared, off-line data are collected. In the
captive mode, it collects off-line data with the BSY assertion as is, then clears the
BSY when collection of data is completed.
SN Off-line data collection mode
00h: Off-line diagnosis (off-line mode)
01h: Simple self test (off-line mode)
02h: Comprehensive self test (off-line mode)
7Fh: Self test stop
81h: Simple self test (captive mode)
82h: Comprehensive self test (captive mode)
X’D5’ SMART Read Log Sector:
A device which receives this sub-command asserts the BSY bit, then reads the
log sector specified in the SN register. Next, it clears the BSY bit and transmits
the log sector to the host computer. 01h should be specified in the SC register.
SN: Log sector
01h: SMART error log
06h: SMART self test log
80h-9Fh: Host vendor log
* See Table 5.11 concerning the SMART error log data format.
See Table 5.12 concerning the SMART self test log data format.