Interface
Table 5.22 Selective self-test log data structure
Byte Item
00h, 01h
Data Structure Revision Number
02h...09h Starting
LBA
0Ah...11h
Test Span 1
Ending LBA
12h...19h Starting
LBA
1Ah...21h
Test Span 2
Ending LBA
22h...29h Starting
LBA
2Ah...31h
Test Span 3
Ending LBA
32h...39h Starting
LBA
3Ah...41h
Test Span 4
Ending LBA
42h...49h Starting
LBA
4Ah...51h
Test Span 5
Ending LBA
52h...151h Reserved
152h...1EBh Vender
Unique
1Ech...1F3h
Current LBA under test
1F4h...1F5h
Current Span under test
1F6h...1F7h Feature
Flags
1F8h
Offline Execution Flag
1F9h
Selective Offline Scan Number
1FAh, 1FBh
Vender Unique
Reserved
1FCh, 1FDh
Selective Self-test pending time [min]
1FEh, 1FFh
Checksum
•
Test Span
Selective self-test log provides for the definition of up to five test spans. If the
starting and ending LBA values for a test span are both zero, a test span is not
defined and not tested.
•
Current LBA under test
As the self-test progress, the device shall modify this value to contain the LBA
currently being tested.
5-70
C141-E249
Summary of Contents for MHW2040BS
Page 1: ...C141 E249 01EN MHW2120BS MHW2100BS MHW2080BS MHW2060BS MHW2040BS DISK DRIVES PRODUCT MANUAL ...
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Page 86: ...Interface Figure 5 2 Example of the circuit for driving Ready LED 5 12 C141 E249 ...
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