CY7C1386DV25, CY7C1386FV25
CY7C1387DV25, CY7C1387FV25
Document Number: 38-05548 Rev. *E
Page 11 of 30
IEEE 1149.1 Serial Boundary Scan (JTAG)
The CY7C1386DV25/CY7C1387DV25/CY7C1386FV25/
CY7C1387FV25 incorporates a serial boundary scan test
access port (TAP).This part is fully compliant with 1149.1. The
TAP operates using JEDEC-standard 3.3V or 2.5V IO logic
levels.
The CY7C1386DV25/CY7C1387DV25/CY7C1386FV25/
CY7C1387FV25 contains a TAP controller, instruction register,
boundary scan register, bypass register, and ID register.
Disabling the JTAG Feature
It is possible to operate the SRAM without using the JTAG
feature. To disable the TAP controller, TCK must be tied LOW
(V
SS
) to prevent clocking of the device. TDI and TMS are
internally pulled up and may be unconnected. They may
alternately be connected to V
DD
through a pull up resistor.
TDO should be left unconnected. Upon power up, the device
will come up in a reset state which will not interfere with the
operation of the device.
TAP Controller State Diagram
The 0 or 1 next to each state represents the value of TMS at
the rising edge of TCK.
Test Access Port (TAP)
Test Clock (TCK)
The test clock is used only with the TAP controller. All inputs
are captured on the rising edge of TCK. All outputs are driven
from the falling edge of TCK.
Test MODE SELECT (TMS)
The TMS input is used to give commands to the TAP controller
and is sampled on the rising edge of TCK. This pin may be left
unconnected if the TAP is not used. The ball is pulled up
internally, resulting in a logic HIGH level.
Test Data-In (TDI)
The TDI ball is used to serially input information into the
registers and can be connected to the input of any of the
registers. The register between TDI and TDO is chosen by the
instruction that is loaded into the TAP instruction register. For
information on loading the instruction register, see
TAP
Controller State Diagram
. TDI is internally pulled up and can
be unconnected if the TAP is unused in an application. TDI is
connected to the most significant bit (MSB) of any register.
(See
TAP Controller Block Diagram
.)
Test Data-Out (TDO)
The TDO output ball is used to serially clock data out from the
registers. The output is active depending upon the current
state of the TAP state machine. The output changes on the
falling edge of TCK. TDO is connected to the least significant
bit (LSB) of any register. (See
TAP Controller State Diagram
.)
TAP Controller Block Diagram
Performing a TAP Reset
A RESET is performed by forcing TMS HIGH (V
DD
) for five
rising edges of TCK. This RESET does not affect the operation
of the SRAM and may be performed while the SRAM is
operating.
At power up, the TAP is reset internally to ensure that TDO
comes up in a High-Z state.
TAP Registers
Registers are connected between the TDI and TDO balls and
allow data to be scanned into and out of the SRAM test
circuitry. Only one register can be selected at a time through
the instruction register. Data is serially loaded into the TDI ball
on the rising edge of TCK. Data is output on the TDO ball on
the falling edge of TCK.
TEST-LOGIC
RESET
RUN-TEST/
IDLE
SELECT
DR-SCAN
SELECT
IR-SCAN
CAPTURE-DR
SHIFT-DR
CAPTURE-IR
SHIFT-IR
EXIT1-DR
PAUSE-DR
EXIT1-IR
PAUSE-IR
EXIT2-DR
UPDATE-DR
EXIT2-IR
UPDATE-IR
1
1
1
0
1
1
0
0
1
1
1
0
0
0
0
0
0
0
0
0
1
0
1
1
0
1
0
1
1
1
1
0
Bypass Register
0
Instruction Register
0
1
2
Identification Register
0
1
2
29
30
31
.
.
.
Boundary Scan Register
0
1
2
.
.
x
.
.
.
S
election
Circuitr
y
Selection
Circuitry
TCK
TMS
TAP CONTROLLER
TDI
TDO
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