Cypress Semiconductor CY62157ESL, Specification Sheet

Page: 4 / 12

CY62157ESL MoBL
®
Document #: 001-43141 Rev. ** Page 4 of 12
Capacitance
Tested initially and after any design or process changes that may affect these parameters.
Parameter Description Test Conditions Max Unit
C
IN
Input Capacitance T
A
= 25°C, f = 1 MHz, V
CC
= V
CC(typ)
10 pF
C
OUT
Output Capacitance 10 pF
Thermal Resistance
Tested initially and after any design or process changes that may affect these parameters.
Parameter Description Test Conditions TSOP II Unit
Θ
JA
Thermal Resistance
(Junction to Ambient) Still Air, soldered on a 3 × 4.5 inch, two-layer
printed circuit board 77
°
C/W
Θ
JC
Thermal Resistance
(Junction to Case) 13
°
C/W
AC Test Loads and Waveforms
Parameters 2.5V 3.0V 5.0V Unit
R1 16667 1103 1800
Ω
R2 15385 1554 990
Ω
R
TH
8000 645 639
Ω
V
TH
1.20 1.75 1.77 V
V
CC
V
CC
OUTPUT
R2
30 pF
INCLUDING
JIG AND
SCOPE
GND
90%
10%
90%
10%
Rise Time = 1 V/ns
Fall Time = 1 V/ns
OUTPUT V
Equivalent to: THÉ VENIN EQUIVALENT
ALL INPUT PULSES
R
TH
R1
TH
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