RS-232 AND V.35 STANDARD PATCH PANELS
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6. Intrusive Testing
Performing intrusive testing (a) breaks a patch module’s DCE to DTE signal pathway, (b) routes the DCE or
DTE signal to the test module, to external test equipment, or both, and (c) permits interactive testing of the
DCE or DTE signals.
6.1 Intrusive Testing to a Patch Module DCE
During an intrusive test to a patch module DCE, you can monitor the patch module’s DCE signals through its
MON patch cavity. See
Chapter 4
for more information. You CANNOT monitor the patch module’s DTE
signals through its MON patch cavity. The patch module’s LEDs are connected to the DCE signals only. The
circuits between the patch module’s DCE and DTE signals are broken. Only the patch module’s DCE signals
are connected to the test module and/or external test equipment. Interactive testing of the DCE signals is
possible using the test module and/or external test equipment.
6.1.1 T
EST
M
ODULE TO
DCE
To connect an intrusive test from a test module to a patch module’s DCE:
1. Connect one end of a test patch cord to the patch module’s DCE patch cavity (see Figure 6-1).
2. Connect the opposite end of the same test patch cord to the test module’s MON patch cavity.
Example of Intrusive Testing from a Test Module
In this example, the test module’s MON patch cavity is connected, via a patch cord, to patch module 2’s DCE
patch cavity. This permits the interactive testing of signals passing through patch module 2’s DCE.
