ADTRAN DSU IV ESP, User Manual

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Chapter 13. Testing and Troubleshooting
61204011L1-1 DSU IV ESP User Manual 13-9
Table 13-4. DTE With Test Pattern Commands
Front Panel AT Command Description
1 - 2047 Pattern _T0&T8 Standard 2047 random data pattern.
2 - 511 Pattern _T1&T8 Standard 511 random data pattern.
3 - Stress Pattern # 1 _T2&T8 Stress pattern with alternating high and
low ones densities. Repeated pattern of
100 octets:
1111 1111, followed by 100 octets:
0000 0000.
4- Stress Pattern # 2 _T3&T8 Stress pattern with alternating medium
and low ones densities. Repeated pattern
of 100 octets:
0111 1110, followed by 100 octets:
0000 0000.
5 - Stress Pattern # 3 _T4&T8 Stress pattern with medium ones density.
Continuous series of octets:
0011 0010.
6 - Stress Pattern # 4 _T5&T8 Stress pattern with low ones density.
Continuous series of octets:
0100 0000.