PC-505B Manual, Rev. 201013
Warner
Instruments
A Harvard Apparatus Company
8
CONTROL DESCRIPTION
The instrument front panel is divided into several control blocks. Controls within these
blocks are dedicated towards a common functional purpose. Each control block is outlined in
blue and is clearly labeled as
COMMANDS
,
FAST CAP COMP
,
WHOLE CELL
,
and
OUTPUT
. A final section
contains the LCD
METER
,
as well as the
METER SELECT
and
POWER
switches. This section will be
referred to as the
METER
block.
Front panel
C
OMMANDS
block
The
COMMANDS
block
contains the
VOLTAGE
and
CURRENT
HOLDING
controls, the
JUNCTION
ZERO
controls, and a
COMMAND SELECT
toggle switch
selecting internal or external
command inputs. This block
also contains several controls for
adjusting the sensitivity of input
commands,
as well as controls
for the
ZAP
function.
Voltage and current commands
The
VOLTAGE
and
CURRENT
HOLD
controls provide independent modification of holding potential and holding current
settings within the ranges
± 200 mV
and
± 1.0 nA
, respectively. A
MODE
toggle switch in the
OUTPUT
command block is used to select between voltage clamp (
V
c
) or current clamp (
I
c
)
modes. Placing the instrument in current or voltage clamp mode activates either the
VOLTAGE
or
CURRENT
HOLD
controls, respectively. This structure allows switching between voltage and
current clamping configurations without the need to readjust settings. V
OLTAGE
and
CURRENT
HOLD
controls are not attenuated by
COMMAND SENSITIVITY
settings.
Internal command, external command, and command sensitivity
The
COMMAND SELECT
toggle switch selects between an internally generated (
internal
command
) or an externally generated (
external command
) command that is applied to the
COMMAND IN
BNC located on the instrument rear panel.
NOTE
: When set to
external command
, the
COMMAND SENSITIVITY
controls attenuate the signal
applied to the
COMMAND IN
BNC located on the instrument rear panel. When set to
internal
command
, the
COMMAND SENSITIVITY
controls select the scaling of the internally generated
TEST PULSE
.
The
COMMAND SENSITIVITY
controls are comprised of an
on/off
toggle and a sensitivity
selector. The
SENSITIVITY SELECTOR
attenuates either the internally generated
TEST PULSE
or