WAGO I/O SYSTEM FIELD 765-2704/200-000, Руководство по эксплуатации продукта

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765-2704/200-000 Diagnostics
Product manual | Version: 1.0.0 31
2AO FLD IOL CONV 0-10V
Table 41: Variables – Detailed Diagnostics
Name Description Subindex Data
Type
Length Factory
Setting Value Range [h]
Detailed device
status List of all cur-
rently pending
events of the
product 0 ArrayT 24 bytes 00 00 00 -
11.2.3 Active Events
Table 42: Variables – Active Events – General
Index 545
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Table 43: Variables – Active Events
Name Description Subindex Data
Type
Length Factory
Setting Value Range
Active Events Bit mask for
currently pend-
ing events 0 RecordT 32 bits - -
Bit_31 Test Event 2.
Product status
= 1 (Mainte-
nance required) bitOffset
31 BooleanT 1 bit 0 0 (noEv)
1 (0x8DFF)
Bit_30 Test Event 1.
Product status
= 1 (Mainte-
nance required) bitOffset
30 BooleanT 1 bit 0 0 (noEv)
1 (0x8DFE)
Bit_16 Short circuit bitOffset
16 BooleanT 1 bit 0 0 (noEv)
1 (0x7710)
Bit_15 Permissible
product tem-
perature ex-
ceeded bitOffset
15 BooleanT 1 bit 0 0 (noEv)
1 (0x4210)
Bit_8 Process value
outside valid
range bitOffset
8 BooleanT 1 bit 0 0 (noEv)
1 (0x8C10)
Bit_4 Temperature
error bitOffset
4 BooleanT 1 bit 0 0 (noEv)
1 (0x4000)
Bit_1 Parameter er-
ror bitOffset
1 BooleanT 1 bit 0 0 (noEv)
1 (0x6320)
Bit_0 Hardware fault
in product bitOffset
0 BooleanT 1 bit 0 0 (noEv)
1 (0x5000)
11.2.4 Parameter Setting Errors
Table 44: Variables – Parameter Setting Errors – General
Index 546
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