TappingMode AFM
Basic TappingMode AFM Operation
Rev. D
Dimension 3100 Manual
133
represents the same cantilever at the sample surface. Although the piezo stack continues
to excite the cantilever substrate with the same energy, the tip deflects in its encounter with the
surface. The reflected laser beam reveals information about the vertical height of the sample surface
and characteristics of the sample material itself. These material characteristics include elasticity,
magnetism, and presence of electrical forces.
Figure 9.1b
Tapping Cantilever on Sample Surface
Note:
Deflection of the cantilever and return signal are exaggerated in the figure for
illustrative purposes.
9.2
Basic TappingMode AFM Operation
The following is a general outline of basic operational procedures involved in TappingMode AFM.
For more detailed instructions, refer to
9.2.1 Select Mode of Operation
•
Select
Microscope
>
Profile
.
•
Select
TappingMode
as the mode of operation.
Return signal
(deflected)
Laser beam
Sample surface
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