User's Manual l TQMa335xL UM 0101 l © 2019, TQ-Systems GmbH
Page 27
Pinout TQMa335xL (continued)
Table 39:
TQMa335xL pad description
TQMa335xL ball
Signal
Pad name
I/O
AM335x ball
A10
DGND
–
P
–
A11
VDD-PLL_TEST
Test voltage
O
–
A12
EXTINT# (NMI#)
EXTINT#
I
B18
A13
PMIC_PWRON
TPS65910A31 Pin PWRON
I
–
A14
VDDSHV
Test voltage
O
–
A15
MCASP0_AXR2
MCASP0_AXR2
I/O
C12
A16
MCASP0_AXR0
MCASP0_AXR0
I/O
D12
A2
AIN0
AIN0
A
B6
A3
AIN2
AIN2
A
B7
A4
AIN4
AIN4
A
C8
A5
AIN6
AIN6
A
A8
A6
DGND
–
P
–
A7
VCC3V3
–
P
–
A8
VCC3V3
–
P
–
A9
VCC3V3
–
P
–
B1
DGND
–
P
–
B10
DGND
–
P
–
B11
DGND
–
P
–
B12
DGND
–
P
–
B13
PMIC_INT1
TPS65910A31 Pin INT1
O
–
B14
VDD-USB_TEST
Test voltage
O
–
B15
MCASP0_AXR3
MCASP0_AXR3
I/O
A14
B16
MCASP0_AXR1
MCASP0_AXR1
I/O
D13
B17
MCASP0_FSX
MCASP0_FSX
I/O
B13
B2
AIN1
AIN1
A
C7
B3
AIN3
AIN3
A
A7
B4
AIN5
AIN5
A
B8
B5
AIN7
AIN7
A
C9
B6
DGND
–
P
–
B7
VCC3V3
–
P
–
B8
VCC3V3
–
P
–
B9
VCC3V3
–
P
–
C1
I2C0_SCL
I2C0_SCL
I/O
C16
C10
VDDS-RTC_TEST
Test voltage
O
–
C11
DGND
–
P
–
C12
DGND
–
P
–
C13
VDDS-CORE_TEST
Test voltage
O
–
C14
DGND
–
P
–
C15
MCASP0 ACLKX
MCASP0 ACLKX
I/O
A13
C16
MCASP0 ACLKR
MCASP0 ACLKR
I/O
B12
C17
MCASP0_FSR
MCASP0_FSR
I/O
C13
C2
DGND
–
P
–
C3
TMS
TMS
I
C11
C4
TDI
TDI
I
B11
C5
DGND
–
P
–
C6
EXT_WAKEUP
EXT_WAKEUP
I
C5
C7
VDDS-DDR_TEST
Test voltage
O
–
C8
DGND
–
P
–
C9
VBACKUP_PMIC
Backup Voltage for PMIC
P
–