Toshiba Satellite Pro C650, Руководство по обслуживанию

Страница: 99 / 218

3 Diagnostic Programs 3.6 Memory Test
In addition to the above pattern test of the memory, there is Read/Write Cycle test
and Read Cycle Test for the extended memory.
Below is the parameter dialog window of the extended pattern test.
Test Range:
Specify the test coverage range of Extended Memory. If
user chooses Total Size, it means that the whole Extended Memory
will be tested. Although user can input the parameter into other select
box, but the selected result is invalid. If user chooses Special Size, the
test of Extended Memory will be taken according to the coverage
range that user chooses or time.
Extended Memory Start Address and Extended Memory End
Address (MB)
: Set the range of extended memory that is to be tested.
The test coverage will be according to the value setting in ‘Percent
(%)’ mentioned at below.
Percent (%):
Choose the percentage of the defined range of the
memory to be tested.
Time Limit(h):
Choose or Input the time (hour) of the defined range
of the memory to be tested;
Time Limit(m):
Choose or Input the time (minute) of the defined
range of the memory to be tested.
1. Write/Read Cycle Test
Test by using both read and write instructions.
38
Satellite/Satellite Pro/C650/C655 Maintenance Manual