27.16
Analog-to-Digital Converter (ADC)
Table 27-44. ADC Electrical Characteristics for ADC at 1 Msps
ab
Unit
Max
Nom
Min
Parameter Name
Parameter
POWER SUPPLY REQUIREMENTS
V
3.63
3.3
2.97
ADC supply voltage
V
DDA
V
-
0
-
ADC ground voltage
GNDA
VDDA / GNDA VOLTAGE REFERENCE
μF
-
1.0 // 0.01
c
-
Voltage reference decoupling capacitance
C
REF
EXTERNAL VOLTAGE REFERENCE INPUT
V
V
DDA
V
DDA
2.4
Positive external voltage reference for ADC,
when
VREF
field in the
ADCCTL
register is 0x1-
V
REFA+
µA
440
330.5
-
Current on
VREF+
input, using external V
REF+
=
3.3 V
I
VREF
µA
2.0
-
-
DC leakage current on
VREF+
input when
external VREF disabled
I
LVREF
μF
-
1.0 // 0.01
c
-
External reference decoupling capacitance
C
REF
ANALOG INPUT
V
V
DDA
-
0
Single-ended, full- scale analog input voltage,
internal reference
de
V
ADCIN
V
V
VDDA
-
-V
DDA
Differential, full-scale analog input voltage,
internal reference
df
V
V
REFA+
-
GNDA
Single-ended, full-scale analog input voltage,
external reference
e
V
V
REFA+
-
GNDA
-
- (V
REFA+
-
GNDA)
Differential, full-scale analog input voltage,
external reference
g
V
[(V
REFA+
+
V
REFA-
) / 2] ±
0.025
-
-
Input common mode voltage, differential mode
h
VIN
CM
µA
2.0
-
-
ADC input leakage current
i
I
L
kΩ
2.5
-
-
ADC equivalent input resistance
i
R
ADC
pF
10
-
-
ADC equivalent input capacitance
i
C
ADC
Ω
500
-
-
Analog source resistance
i
R
S
SAMPLING DYNAMICS
MHz
-
16
-
ADC conversion clock frequency
j
F
ADC
Msps
1
ADC conversion rate
F
CONV
ns
-
250
-
ADC sample time
T
S
µs
-
1
-
ADC conversion time
k
T
C
ADC clocks
-
2
-
Latency from trigger to start of conversion
T
LT
SYSTEM PERFORMANCE when using external reference
lm
bits
12
Resolution
N
LSB
±3.0
±1.5
-
Integral nonlinearity error, over full input range
INL
LSB
+2.0/-1.0
n
±0.8
-
Differential nonlinearity error, over full input
range
DNL
LSB
±3.0
±1.0
-
Offset error
E
O
LSB
±3.0
±2.0
-
Gain error
o
E
G
1861
June 18, 2014
Texas Instruments-Production Data
Tiva
™
TM4C1294NCPDT Microcontroller