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20
SWRS158B – FEBRUARY 2015 – REVISED JULY 2016
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Specifications
Copyright © 2015–2016, Texas Instruments Incorporated
IEEE 802.15.4 (Offset Q-PSK DSSS, 250 kbps) – TX (continued)
Measured on the TI CC2650EM-5XD reference design with T
c
= 25°C, V
DDS
= 3.0 V, unless otherwise noted.
PARAMETER
TEST CONDITIONS
MIN
TYP
MAX
UNIT
Spurious emission conducted
measurement
f < 1 GHz, outside restricted bands
–43
dBm
f < 1 GHz, restricted bands ETSI
–65
f < 1 GHz, restricted bands FCC
–76
f > 1 GHz, including harmonics
–46
Suitable for systems targeting compliance with worldwide radio-frequency regulations ETSI EN 300 328
and EN 300 440 Class 2 (Europe), FCC CFR47 Part 15 (US), and ARIB STD-T66 (Japan)
(1)
Probing or otherwise stopping the XTAL while the DC-DC converter is enabled may cause permanent damage to the device.
(2)
The crystal manufacturer's specification must satisfy this requirement
(3)
Measured on the TI CC2650EM-5XD reference design with T
c
= 25°C, V
DDS
= 3.0 V
(4)
Includes initial tolerance of the crystal, drift over temperature, ageing and frequency pulling due to incorrect load capacitance. As per
Bluetooth
and IEEE 802.15.4 specification.
(5)
Kick-started based on a temperature and aging compensated RCOSC_HF using precharge injection.
5.14 24-MHz Crystal Oscillator (XOSC_HF)
T
c
= 25°C, V
DDS
= 3.0 V, unless otherwise noted.
(1)
PARAMETER
TEST CONDITIONS
MIN
TYP
MAX
UNIT
ESR Equivalent series resistance
(2)
6 pF < C
L
≤
9 pF
20
60
Ω
ESR Equivalent series resistance
(2)
5 pF < C
L
≤
6 pF
80
Ω
L
M
Motional inductance
(2)
Relates to load capacitance
(C
L
in Farads)
< 1.6 × 10
–24
/ C
L
2
H
C
L
Crystal load capacitance
(2)
5
9
pF
Crystal frequency
(2) (3)
24
MHz
Crystal frequency tolerance
(2) (4)
–40
40
ppm
Start-up time
(3) (5)
150
µs
(1)
The crystal manufacturer's specification must satisfy this requirement
(2)
Includes initial tolerance of the crystal, drift over temperature, ageing and frequency pulling due to incorrect load capacitance. As per
Bluetooth
and IEEE 802.15.4 specification.
5.15 32.768-kHz Crystal Oscillator (XOSC_LF)
T
c
= 25°C, V
DDS
= 3.0 V, unless otherwise noted.
PARAMETER
TEST CONDITIONS
MIN
TYP
MAX
UNIT
Crystal frequency
(1)
32.768
kHz
Crystal frequency tolerance,
Bluetooth
low-
energy applications
(1) (2)
–500
500
ppm
ESR Equivalent series resistance
(1)
30
100
k
Ω
C
L
Crystal load capacitance
(1)
6
12
pF