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Note 1:
“Absolute Maximum Ratings” indicate limits beyond which damage to the device may occur, including inoperability and degradation of device reliability
and/or performance. Functional operation of the device and/or non-degradation at the Absolute Maximum Ratings or other conditions beyond those indicated in
the Recommended Operating Conditions is not implied. The Recommended Operating Conditions indicate conditions at which the device is functional and the
device should not be operated beyond such conditions.
Note 2:
The Electrical Characteristics tables list guaranteed specifications under the listed Recommended Operating Conditions except as otherwise modified or
specified by the Electrical Characteristics Conditions and/or Notes. Typical specifications are estimations only and are not guaranteed.
Note 3:
Typical values represent most likely parametric norms at V
DD33
= 3.3V, V
DDIO
= 1.8V or 3.3V, Ta = +25 degC, and at the Recommended Operation
Conditions at the time of product characterization and are not guaranteed.
Note 4:
Current into device pins is defined as positive. Current out of a device pin is defined as negative. Voltages are referenced to ground except V
OD
and
Δ
V
OD
, which are differential voltages.
Supply noise testing was done with minimum capacitors on the PCB. A sinusoidal signal is AC coupled to the supply pins with amplitude = 100 mVp-p measured
at the device V
DD33
and V
DDIO
pins. Bit error rate testing of input to the serializer and output of the deserializer with 10 meter cable shows no error when the noise
frequency is less than 50MHz.
Note 5:
Supply noise testing was done with minimum capacitors on the PCB. A sinusoidal signal is AC coupled to the V
DD33
and V
DDIO
supplies with amplitude =
100 mVp-p measured at the device V
DD33
and V
DDIO
pins. Bit error rate testing of input to the Ser and output of the Des with 10 meter cable shows no error when
the noise frequency on the Ser is less than 50MHz. The Des on the other hand shows no error when the noise frequency is less than 50 MHz.
Note 6:
t
PLD
is the time required by the device to obtain lock when exiting power-down state with an active PCLK.
Note 7:
Specification is guaranteed by characterization and is not tested in production
Note 8:
Specification is guaranteed by design and is not tested in production
Note 9:
t
TJIT
(@BER of 1E-9) specifies the allowable jitter on RxCLKIN±
Note 10:
Jitter Frequency is specified in conjunction with DS90UH928Q PLL bandwidth.
Note 11:
UI – Unit Interval is equivalent to one ideal serialized bit width. The UI scales with PCLK frequency.
Note 12:
Output jitter specs are dependent upon the input clock jitter at the SER
Note 13:
The DS90UH927Q V
DD33
and V
DDIO
voltages require a specific ramp rate during power up. The power supply ramp time must be less than 1.5ms with
a monotonic rise
Note 14:
PDB is specified to 3.3V LVCMOS only and must be driven or pulled up to V
DD33
or to V
DDIO
≥
3.0V
Note 15:
I
OS
is not specified for an indefinite period of time. Do not hold in short circuit for more than 500ms or part damage may result
Note 16:
I2S specifications for t
LC
and t
HC
pulses must each be greater than 2 PCLK periods to guarantee sampling and supersedes the 0.35*T
I2S_CLK
requirement.
t
LC
and t
HC
must be longer than the greater of either 0.35*T
I2S_CLK
or 2*PCLK
DS90UH927Q
Copyright © 1999-2012, Texas Instruments Incorporated
11
Содержание DS90UH927Q
Страница 15: ...30193006 FIGURE 10 I2S Timing Diagram DS90UH927Q Copyright 1999 2012 Texas Instruments Incorporated 15 ...
Страница 56: ...Revision October 26 2012 Initial Release DS90UH927Q 56 Copyright 1999 2012 Texas Instruments Incorporated ...
Страница 58: ...Notes Copyright 1999 2012 Texas Instruments Incorporated ...