CC2500
SWRS040C
Page 81 of 89
0x2B: AGCTEST – AGC Test
Bit
Field Name
Reset
R/W
Description
7:0
AGCTEST[7:0]
63
(0x3F)
R/W
For test only. Do not write to this register.
0x2C: TEST2 – Various Test Settings
Bit
Field Name
Reset
R/W
Description
7:0
TEST2[7:0]
136 (0x88)
R/W
Set to 0x81 for improved sensitivity at data rates
≤
100 kBaud. The
temperature range is then from 0
o
C to +85
o
C.
0x2D: TEST1 – Various Test Settings
Bit
Field Name
Reset
R/W
Description
7:0
TEST1[7:0]
49 (0x31)
R/W
Set to 0x35 for improved sensitivity at data rates
≤
100 kBaud. The
temperature range is then from 0
o
C to +85
o
C.
0x2E: TEST0 – Various Test Settings
Bit
Field Name
Reset
R/W
Description
7:2
TEST0[7:2]
2 (0x02)
R/W
The value to use in this register is given by the SmartRF
Studio
software [5].
1
VCO_SEL_CAL_EN
1
R/W
Enable VCO selection calibration stage when 1
0
TEST0[0]
1
R/W
The value to use in this register is given by the SmartRF
Studio
software [5].
32.3
Status Register Details
0x30 (0xF0): PARTNUM – Chip ID
Bit
Field Name
Reset
R/W
Description
7:0
PARTNUM[7:0]
128 (0x80)
R
Chip part number
0x31 (0xF1): VERSION – Chip ID
Bit
Field Name
Reset
R/W
Description
7:0
VERSION[7:0]
3 (0x03)
R
Chip version number.
0x32 (0xF2): FREQEST – Frequency Offset Estimate from Demodulator
Bit
Field Name
Reset
R/W
Description
7:0
FREQOFF_EST
R
The estimated frequency offset (2’s complement) of the carrier.
Resolution is F
XTAL
/2
14
(1.59 - 1.65 kHz); range is ±202 kHz to
±210 kHz, dependent of XTAL frequency.
Frequency offset compensation is only supported for 2-FSK;
GFSK and MSK modulation. This register will read 0 when
using OOK modulation.
Содержание CC2500
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