20
DIODE
•
Insert the red test lead into the terminal and the black test lead into the COM
terminal. The polarity of the red test lead is positive, and negative for the black test
lead.
•
Set the rotary switch to the measurement where the diode measuring
mode is default. Connect the test leads to both ends of the measured diode as
shown in the image below right.
•
Directly read the approximate forward PN junction voltage of the measured diode
on display.
•
Press the function button
MENU
to view the menu options. If you select the
ALARM
button, the buzzer sounds.
•
If the semiconductor junction shorts out, it will beep continuously.
•
Silicon PN junction drops between 0.5~0.8V as the normal value.
•
If you select the
NORMAL
button, the buzzer will not sound.
Warnings
•
If the measured diode is in open circuit or the polarity
is reversed, “OL” will display.
•
When measuring the in-circuit diode, all of the power
within the measured circuit must be shut off before
measurement and all of the capacitors must be
discharged.
•
Open-circuit voltage of the diode test is around 3V.
•
Do not input a voltage higher than 30V in AC (rms),
AC (peak 42V) or 60V in DC to avoid personal injury.
•
After completing all measurement operations,
disconnect the connection between the test leads
and the circuit under test.
FREQUENCY / DUTY CYCLE MEASUREMENT / PULSE WIDTH
•
Insert the red test lead into the V terminal and the black test lead into the COM
terminal.
•
Set the rotary switch to the measurement Hz% ms-Pulse.
•
Press the
SELECT
button to choose between Hz / Duty% / ms-Pulse.
•
Connect the test leads to the signal source under test in parallel as shown below
right.
•
Directly read the measured values of frequency / duty
cycle / pulse width on the display.
Warnings
•
The simulation bar displays the frequency of the
measured signal for duty cycle and pulse width.
•
Do not input a voltage with higher frequency than
30Vrms to avoid personal injury.
•
After completing all measurement operations,
disconnect the connection between the test leads and
the circuit under test.
