
DWC ADC 12b5M SAR, TSMC180 IP Databook
April 2012
Synopsys, Inc.
21-30
9
Production Test
A scan chain was added to the core to enable the user to test the digital calibration block
separately if desired.
Table 3
– Scan mode pins
Name
Value during Normal Mode Value during test mode
scanmode
0
1
scanen
0
Connect to PAD
scanclk
0
Connect to PAD
scanin
0
Connect to PAD
scanout
0
Connect to PAD
For scan testing the
scanmode
signal should be set to
high
in order to connect all flip-flops to
the input clock. Scan test input signal is
scanin
pin, test output signal is
scanout
pin and test
control signal is
scanen
. The maximum scan clock frequency is 50MHz.