![Spectris Particle Measuring Systems Airnet II 201-4 Скачать руководство пользователя страница 42](http://html.mh-extra.com/html/spectris/particle-measuring-systems-airnet-ii-201-4/particle-measuring-systems-airnet-ii-201-4_operation-manual_1344041042.webp)
Particle-Induced Counts
Chapter 6
: Troubleshooting
Airnet® II 4-Channel Particle Sensors Operations Manual
6-3
Particle-Induced Counts
If background counts are too high, it is usually due to contamination within the
isokinetic sampling horn.
To clean the isokinetic sampling horn:
1.
Remove both the isokinetic sampling horn and jet and flush both with a
cleaning solvent (alcohol, acetone, and so on).
2.
Dry the isokinetic sampling horn and the jet using clean pressurized air.
3.
Replace the jet and horn. Make sure to line up the alignment indicators.
Transient-Induced Counts
Line transients (RFI or EMI noise counts) are generally subtle and unique to a certain
installation. If these counts are suspected, call your Particle Measuring Systems
representative.