Sony HDVF-L750, Руководство по обслуживанию

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3-3. Internal Test Signal
A PR-332 board mounts an internal test signal generator circuit and a test pin (TP700) for checking waveform.
An internal test signal (TEST1, TEST2) can be selected from the SERVICE menu, and can be outputted. (For more
details, refer to
“4. Setup Menu” , “4-2-3. SERVICE Menu” )
Test point for waveform
The signal waveform of the test points ( [1] to [7] ) can be outputted to the test pin (TP700) .
A defective point can be specified by observing the waveforms at test pin (TP700) .
[1]
[2]
[3]
DISPLAY
PROCESSOR
SDI
EQ
Two screens
synthesis
SIGNAL
PROCESSOR
SIGNAL
PROCESSOR
IC1 IC2
SDI IN
LVDS
TX
ADC
IC300
Camera connector
(Round, 20-pin)
(Rectangular, 26-pin)
Camera connector
IC500
TEST1 TEST2
[4]
[5]
[7]
[6]
IC500
Test signal setting switch/ Test pin
PR-332 board (A side)
E D C A B
F
TP700
1
2
3
4
S1202
TEST SIGNAL
Switch the S1202 (bits 1 and 2) to change the kind of the signal to output to the test pin (TP700) .
Output signal S1202 setting
bit1 bit2
Y or G OFF OFF
Pb or B ON OFF
Pr or R OFF ON
——— (No output) ON ON
TEST POINT
Switch the S1202 (bits 3,4 and 5) to change the point ( [1] to [7] ) of the signal to output to the test pin (TP700) .
Check point S1202 setting
bit3 bit4 bit5
[1] OFF OFF OFF
Continued
HDVF-L750/HDVF-L770
3-3