Samsung SDC-30, Руководство по обслуживанию

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Alignment and Adjustments
5-8 Samsung Electronics
5. Process for adjustment failure
* Communication port XX cannot be used. Select another port.
-> Cannot use com port XX. Select another com port.
* RISC Processor isn't active.
-> RISC Processor does not respond.
* Can't receive the specified data data count from camera.
-> Camera Communication Error.
* There is a fatal error in <NG> DRAM circuit.
-> DRAM Test error occured.
* A fatal error occurs during <NG> ASIC test.
-> ASIC Test error occured.
* A fatal error occurs during <NG> Vsub adjustment.
-> V-sub adjust error occured. (Fig.5-14)
* Memory has been previously formatted.
-> Memory was already formatted.
* An error occurs in flash memory.
-> Flash Memory has defective area.
-> Flash Memory clearing error occured.
-> Flash Memory system block error occured.
* New flash memory.
-> Flash memory is rare.
* B value is larger than R value in <NG> 3100 °K level test.
-> 3100 °K AWB adjust error (B > R). RG xx / BG yy);
* R value exceeds the range in <NG> 3100 °K level test.
-> 3100 °K AWB adjust error (R value is out of bound). RG xx
* B value exceeds the range in <NG> 3100 °K level test.
-> 3100 °K AWB adjust error (B value is out of bound). BG yy
* R value is larger than B value in <NG> 5100 °K level test.
-> 5100
°K
AWB adjust error (B > R) . RG xx / BG yy
* R value exceeds the range in <NG> 5100 °K level test.
-> 5100 °K AWB adjust error (R value is out of bound) . RG xx
* B value exceeds the range in <NG> 5100 °K level test.
-> 5100 °K AWB adjust error (B value is out of bound) . BG yy