27
FX-MG8006ZT,MG8006ZT-91,MG8506ZT,MG8506ZT-91
3
CH1: FIN
1V/div.
$
CH2: HOLD
5V/div.
Normal mode: The defect part passes 800
µ
m
8
CH1: TEY
0.5V/div.
6
CH2: FEY
0.1V/div.
Normal mode: AGC after focus close
8
CH1: TEY
0.5V/div.
!
CH2: SD
0.5V/div.
5ms/div.
0
SIN
1V/div.
10ms/div.
Long Search
8
CH1: TEY
1V/div.
#
CH2: TEC
1V/div.
Test mode: Focus close
Tracking open
2ms/div.
6
CH1: FEY
0.2V/div.
3
CH2: FIN
0.5V/div.
Normal mode: During AGC
1ms/div.
@
EFM
1V/div.
2
µ
s/div.
Play
0.2s/div.
5
µ
s/div.
^
LRCK
2V/div.
10
µ
s/div.
*
ADRMON
1V/div.
1s/div.
Normal mode: Starting play
GND
→
REFOUT
→
REFOUT
→
REFOUT
→
REFOUT
→
REFOUT
→
REFOUT
→
REFOUT
→
REFOUT
→
REFOUT
→
REFOUT
→
REFOUT
→
REFOUT
→
REFOUT
→
1
CH1: RFO
1V/div.
$
CH2: HOLD
5V/div.
Normal mode: The defect part passes 800
µ
m
500
µ
s/div.
REFOUT
→
REFOUT
→
8
CH1: TEY
0.2V/div.
9
CH2: TIN
0.5V/div.
Normal mode: During AGC
1ms/div.
REFOUT
→
REFOUT
→
GND
→
GND
→
500
µ
s/div.
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