26
FX-MG8006ZT,MG8006ZT-91,MG8506ZT,MG8506ZT-91
1
RFO
0.5V/div. 0.2
µ
s/div.
Normal mode: play
1
CH1: RFO
1V/div.
2
CH2: MIRR
5V/div.
Test mode: Tracking open
0.5ms/div.
1
CH1: RFO
1V/div.
2
CH2: MIRR
5V/div.
Normal mode: The defect part
passes 500µs/div.
0.5ms/div.
3
CH1: FIN
0.5V/div.
4
CH2: FOP
2V/div.
Test mode: No disc, Focus close
0.2s/div.
3
CH1: FIN
0.5V/div.
5
CH2: FOK
2V/div.
Normal mode: Focus close
0.2s/div.
6
CH1: FEY
0.5V/div.
7
CH2: XSI
2V/div.
Normal mode: Focus close
1ms/div.
8
CH1: TEY
0.5V/div.
9
CH2: TIN
0.5V/div.
Test mode: 32 tracks jump (FWD)
0.5ms/div.
8
CH1: TEY
0.5V/div.
9
CH2: TIN
0.5V/div.
Test mode: Single jump (FWD)
0.5ms/div.
3
CH1: FIN
0.5V/div.
0
CH2: SIN
1V/div.
Normal mode: Focus close
0.5s/div.
GND
→
GND
→
GND
→
-
Waveforms
0
SIN
0.5V/div.
0.1s/div.
Normal mode: Play
REFOUT
→
REFOUT
→
REFOUT
→
REFOUT
→
REFOUT
→
REFOUT
→
REFOUT
→
REFOUT
→
REFOUT
→
REFOUT
→
REFOUT
→
REFOUT
→
REFOUT
→
REFOUT
→
REFOUT
→
1
RFO
0.5V/div. 0.5
µ
s/div.
Test mode
REFOUT
→
REFOUT
→
REFOUT
→
Note:1. The encircled numbers denote measuring pointes in the circuit diagram.
2. Reference voltage
REFOUT:2.5V
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