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PGA26E07BA-SWEVB008 Ver. 1.2
23
Switching Characteristics Result:
Condition: VPN=400V, V
AUXH
, V
AUXL
=12V, (Rgon) RA1,RB1 =15Ω, RA2,RB2=0Ω, RA3,RB3=1Ω ,CA3,CB3=2.2nF
I.
Low side device (QA) Switching loss Measurement Data
II.
Loss Test Measurement Waveform
VPN=400V, I
DS
=2.5A
VPN=400V, I
DS
=15A
Turn
ON
Power loss = 11.9µJ
Power loss = 17µJ
Turn
OFF
Power loss = 5.18µJ
Power loss = 22.6µJ
Time scale:20ns/div
5GS/s
Power Loss uJ
IL 5A/div
VDS 100V/div
IDS 5A/div
Time scale:20ns/div
5GS/s
Time scale:20ns/div
5GS/s
Time scale:20ns/div
5GS/s
Power Loss uJ
IL 5A/div
VDS 100V/div
IDS 5A/div
Power Loss uJ
IL 5A/div
VDS 100V/div
IDS 5A/div
Power Loss uJ
IL 5A/div
VDS 100V/div
IDS 5A/div
Important Note: The data presented is meant to demonstrate the low switching loss feature of Panasonic X-GaN.
The loss data is for reference use only and measured data maybe different depending on evaluation environment.
Figure 31: Turn on switching loss for QA
Figure 32: Turn off switching loss for QA
Figure 33: QA loss test waveforms at I
DS
=2.5A
Figure 34: QA loss test waveforms at I
DS
=15A
Содержание PGA26E07BA-SWEVB008
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