2
Fig. 2.1. Typical Noise as a Function of
Capacitance Measured with an ORTEC
572 Amplifier and 2-
:
s Time Constant.
2. SPECIFICATIONS
2.1. PERFORMANCE
NOISE (Figs. 2.1 and 2.2)
Detector
Maximum
Capacitance
Noise
Model
(PF)
(KeV) (Si)
142A
0
1.60
142A
100
3.40
142B
100
3.20
142B
1000
19.00
142C
400
7.20
142C
1000
14.50
142C
2000
27.00
INTEGRAL NONLINEARITY
#
0.03%
TEMPERATURE INSTABILITY
142A
<±50 ppm/°C from 0 to 50°C.
142B
<±100 ppm/°C from 0 to 50°C.
142C
<±100 ppm/°C from 0 to 50°C.
OPEN LOOP GAIN
142A
>40,000
142B
>80,000
142C
>80,000
CHARGE SENSITIVITY (Si equivalent)
142A
Nominally 45 mV/MeV
142B
Nominally 20 mV/MeV
142C
Nominally 20 mV/MeV
ENERGY RANGE
142A
0 — 200 MeV
142B
0 — 400 MeV
142C
0 — 400 MeV
RISE TIME, 0 to +0.5 V Pulse at E output on 93
S
Load (Fig. 2.3)
142A
<5 ns at 0 pF; < 12 ns at 100 pF.
142B
<5 ns at 100 pF; < 25 ns at 1000 pF.
142C
<11 ns at 400 pF; < 20 ns at 1000 pF.
DECAY TIME
142A
Nominally 500
:
s.
142B
Nominally 1000
:
s.
142C
Nominally 1000
:
s.
R E CO M M E NDE D R AN G E O F I N P U T
CAPACITANCE
142A
0 to 100 pF.
142B
100 to 400 pF.
142C
400 to 2000 pF.
DETECTOR BIAS VOLTAGE ±1000V maximum.
2.2. INPUTS
INPUT Accepts input signals from semiconductor
charged-particle detector and extends operating
bias to the detector.
BIAS Accepts the detector bias voltage from a
power supply.
TEST Accepts input voltage pulses from a pulse
generator for instrument and system calibration;
R
in
= 93
S
.