TWR-SB0410-36EVB tower system platform
, Rev. 1.0
10
NXP Semiconductors
Getting to know the hardware
4.4.2 Test point definitions
The following test points are provided for signal analysis of the MC34SB0410 device.
Figure 6. Test point locations
Table 4. Test points
Schematic label
Description
TP1
Indicates DOSV signal (digital output signal)
TP2
Indicates ADIN1 signal (10-bit ADC)
TP3
Indicates ADIN2 signal (10-bit ADC)
TP4
Indicates ADIN3 signal (10-bit ADC)
TP5
Indicates MISO signal
TP6
Indicates PDI input for DC motor gate driver signal
TP7 & TP15
Power jumper connections that can be used for Motor signal analysis
TP8
Indicates MOSI signal
TP9
Indicates SPI / Chip Select signal
TP10
Indicates SPI clock signal
TP11
Indicates Reset signal
TP14
TP8
TP13
TP12
TP15 TP7
TP10
TP5
TP11
TP4
TP3
TP2
TP1
TP6
TP9