LPC5411x
All information provided in this document is subject to legal disclaimers.
© NXP Semiconductors N.V. 2018. All rights reserved.
Product data sheet
Rev. 2.1 — 9 May 2018
64 of 105
NXP Semiconductors
LPC5411x
32-bit ARM Cortex-M4/M0+ microcontroller
[2]
Simulated using 10 cm of 50
Ω
PCB trace with 5 pF receiver input. Rise and fall times measured between
80 % and 20 % of the full output signal level.
[3]
The slew rate is configured in the IOCON block the SLEW bit. See the
LPC5411x UM10914
user manual.
[4]
C
L
= 20 pF. Rise and fall times measured between 90 % and 10 % of the full input signal level.
11.3 Wake-up process
[1]
Typical ratings are not guaranteed. The values listed are at room temperature (25
C), nominal supply
voltages.
[2]
The wake-up time measured is the time between when a GPIO input pin is triggered to wake the device up
from the low power modes and from when a GPIO output pin is set in the interrupt service routine (ISR)
wake-up handler.
[3]
FRO enabled, all peripherals off. PLL disabled.
[4]
RTC disabled. Wake up from deep power-down causes the part to go through entire reset
process. The wake-up time measured is the time between when the RESET pin is triggered to wake the
device up and when a GPIO output pin is set in the reset handler.
[5]
FRO disabled.
Table 23.
Dynamic characteristic: Typical wake-up times from low power modes
V
DD
= 3.3 V;T
amb
= 25
C; using FRO as the system clock.
Symbol Parameter
Conditions
Min
Typ
Max Unit
t
wake
wake-up
time
from Sleep mode
-
2.0
-
s
from Deep-sleep mode
-
19
-
s
from deep power-down mode;
RTC disabled; using RESET pin.
-
1.2
-
ms