NED
UME-0031-03
Sui7440
29
4.2.17 Data level conversion selection
Selects the data level conversion.
Format 2
CMD VAL CR
CMD
c
VAL
0,1
<Example>
c1CR
>OK
>c1
4.2.18 Data Level Adjustment Minimum Value
Sets Data Level Adjustment Minimum Value
Format 2
CMD VAL CR
CMD
s
VAL
0 ~ 4095
<Example>
s1024CR
>OK
>s1024
4.2.19 Data Level Adjustment Maximum Value
Sets Data Level Adjustment Maximum Value
Format 2
CMD VAL CR
CMD
S
VAL
0 ~ 4095
<Example>
S3072CR
>OK
>S3072
4.2.20 Generating Test Pattern
Generates test pattern.
•
Format 2 CMD VAL CR
•
CMD T
•
VAL 0,1 (0:Image data, 1: Test pattern)
<Example>
T1CR (Generating test pattern)
>OK
>T1