National Semiconductor LM26LV, Руководство пользователя

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4
.4 Bill of Materials for LM26LV Evaluation Board
Item Quantity Reference Part
1 2 C1, C2 Capacitor, Ceramic, 0.01 uF
2 1 C3 Capacitor Ceramic, 2.2 uF
3 4 J1, J2, J3, J4 Header, 1X2, 0.1 in centers
4 1 J5 Header, 1X6, 0.1 in centers
6 2 R1, R2 Resistor, 100k
7 1 R3 Resistor, (not stuffed)
8 1 U1 LM26LVCISD Device Under Test (DUT)
9 1 -- Circuit Board, Fabricated, LM26LVEB Evaluation Board,
Rev. 1
4.5 Mechanical Specifications
4.5.1 Operating Mechanical and Environmental Specifications
Minimum
Typical Maximum
Temperature
0
°
C 25
°
C 70
°
C
4.5.2 Evaluation Board Basic Dimensions
1.650 in/ 4.191 cm
1.050 in/
2.667 cm
4.5.3 Electrostatic Discharge (ESD) Precautions
The user shall use ESD precautions as specified in National Semiconductor ESD document
(SC)CSI-3-038 available through www.national.com.
©
Copyright 2007 National Semiconductor Corporation 9 www.national.com