Glossary
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National Instruments Corporation
G-9
sample
An instantaneous measurement of a signal, normally using an
analog-to-digital converter in an E/M Series DAQ device.
sample rate
The number of samples a system takes over a given time period, usually
expressed in samples per second.
scan
One or more analog samples taken at the same time, or nearly the same
time. Typically, the number of input samples in a scan is equal to the
number of channels in the input group. For example, one scan acquires one
new sample from every analog input channel in the group.
scan rate
The number of scans a system takes during a given time period, usually
expressed in scans per second.
SCXI
Signal Conditioning eXtensions for Instrumentation.
SCXIbus
Located in the rear of an SCXI chassis, the SCXIbus is the backplane that
connects modules in the same chassis to each other.
sensor
A device that converts a physical phenomenon into an electrical signal.
SER CLK
Serial clock signal used to synchronize digital data transfers over the
SER DAT IN and SER DAT OUT lines.
SER DAT IN
Serial data input signal.
SER DAT OUT
Serial data output signal.
shunt calibration
The method of calibrating the gain of a strain-gauge data acquisition
channel by placing a resistor of known value in parallel with a bridge
element.
signal conditioning
The manipulation of signals to prepare them for digitizing.
simulated strain
A strain measurement where the change in bridge output voltage is not
caused by deformation of the specimen being measured; rather, it is caused
by temporarily connecting a known resistance in parallel with one of the
bridge elements while all the strain gauges in the bridge remain unstrained.
Slot 0
Refers to the power supply and control circuitry in the SCXI chassis.
SLOT 0 SEL
Slot 0 select signal.
SPI CLK
Serial peripheral interface clock signal.