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5.
Collect 11 current measurements using the PXIe-4135 and calculate the median.
a)
Repeat this step 10 times in order to collect 10 median calculated values.
b)
Calculate the max-min of all 10 median calculated values. The result should fall
within the test limits specified in the above table.
Verifying Current Offset
Remove all connections from the PXIe-4135 and confirm that the current measured into an
open circuit falls within the test limits.
Complete this procedure only after successfully completing all previous verification
procedures. Verify level ranges in the order listed in the table.
Refer to the following table as you complete the following steps:
Table 6. Current Offset Verification
Level
Range
Limit Range
Limit
Test
Point
As-Found Offset
Test Limit
As-Left Offset Test
Limit
600 mV
10 nA
10 nA
0 mV
±5 pA
±1 pA
1 μA
1 μA
±40 pA
± 17 pA
100 µA
100 µA
±2 nA
±970 pA
1 mA
1 mA
±20 nA
±9.7 nA
10 mA
10 mA
±200 nA
±97 nA
100 mA
100 mA
±2 μA
±970 nA
1 A
1 A
±20 μA
±8.5 μA
3 A
1 A
±600 μA
±85 μA
200 V
10 nA
10 nA
40 V
±5 pA
±1 pA
1.
Disconnect all equipment from the output of the PXIe-4135.
2.
Measure the internal device temperature and perform self-calibration if necessary.
a)
After measuring the internal device temperature, wait for the internal device
temperature to stabilize. Temperature is considered stable when it has not changed
by more than ±1 °C in the previous 5 minutes.
b)
After the internal temperature has stabilized, if the temperature still exceeds
T
cal
± 1 °C, call the self-calibration VI or function.
3.
Set the
niDCPower Aperture Time
property or
NIDCPOWER_ATTR_APERTURE_TIME
attribute to 2 power-line cycles (PLCs) on the
PXIe-4135.
4.
Take a current measurement using the PXIe-4135.
5.
Record the value from the previous step.
PXIe-4135 Calibration Procedure
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