©
National Instruments Corporation
I-3
AT-MIO-16XE-10, 2-3
AT-MIO-16XE-50, 2-5
characteristics, 1-1 to 1-2
features (table), 1-2
B
Bank<1..0> bits, 3-13
BipDac bit, 3-17
bipolar output, 2-21
bitfields, 4-1
bits
AI_FIFO_Empty_St, 2-11
Bank<1..0>, 3-13
BipDac, 3-17
Chan<3..0>, 3-13 to 3-16
ChanEnable, 3-22, 3-23
Channel<2..0>, 3-22, 3-23
ChanType<2..0>, 3-12
D<11..0>, 3-18, 3-19, 3-20
D<15..0>, 3-9, 3-18, 3-19, 3-20
DACSel, 3-16
DitherEn, 3-11
DMATCA, 3-7
DmaTcAClr, 3-21
DMATCB, 3-7
DmaTcBClr, 3-21
DMATCC, 3-7
DmaTcCClr, 3-21
DOTRIG0, 4-49
EEPromCS, 3-5, 5-1
ExtRef, 3-17
Gain<2..0>, 3-11
GenTrig, 3-10
GPCT0<C..A>, 3-26
GPCT1<C..A>, 3-26
GroundRef, 3-17
Input<C..A>, 3-25
Int/Ext Trig, 3-6
LastChan, 3-10
LASTCHANNEL, 2-12
Output<C..A>, 3-25
PROMOUT, 3-7
ReGlitch, 3-17
SerClk, 3-6, 5-1, 5-8
SerDacLd0, 3-5, 5-8
SerDacLd1, 3-5, 5-8
SerDacLd2, 3-5
SerData, 3-6, 5-8
TCIntEnable, 3-22, 3-23
Transfer<2..0>, 3-22, 3-23
Unip/Bip, 3-11
Board Environment Registers, 4-1
Board_Read function, 4-4
Board_Write function, 4-4
buffered pulse width measurement example,
4-44 to 4-46
Buffered_Pulse_Width_Measurement
function, 4-44
bulletin board support, B-1
C
CALDACs. See calibration DACs.
Calibrate_E_Series function, 5-9
calibration
circuitry, 2-10 to 2-11
EEPROM
AT-MIO-16E-1, AT-MIO-16E-2, and
AT-MIO-64E-3 map, 5-2 to 5-4
AT-MIO-16E-10 and
AT-MIO-16DE-10 map, 5-4 to 5-5
AT-MIO-16XE-10 and
AT-AI-16XE-10 map, 5-7
AT-MIO-16XE-50 map, 5-5 to 5-6
calibration constant storage,
2-10 to 2-11, 5-1
reading from, 5-1 to 5-2
writing to accidentally (note), 5-1
NI-DAQ calibration function, 5-9
Содержание AT-AI-16XE-10
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