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National Instruments Corporation
I-9
using interrupts, 4-40 to 4-41
using local buffer mode,
4-36 to 4-38
digital I/O, 4-6
files on Companion Disk, 4-4
general-purpose counter/timer,
4-42 to 4-48
buffered pulse width measurement
example, 4-44 to 4-46
continuous pulse train generation
example, 4-46 to 4-48
gated event counting example,
4-42 to 4-44
PROMOUT bit, 3-7, 5-1
pulse train generation example, 4-46 to 4-48
pulse width measurement example,
4-44 to 4-46
Pulse_Width_Measurement_ISR
function, 4-45
R
referenced single-ended channel assignments
(table), 3-15
registers
Analog Input Register Group
ADC FIFO Data Register, 3-8 to 3-9
Configuration Memory High
Register, 3-12 to 3-16
Configuration Memory Low
Register, 3-10 to 3-11
overview, 3-8
Analog Output Register Group
AO Configuration Register,
3-16 to 3-17
DAC FIFO Data Register, 3-18
DAC0 Direct Data Register, 3-19
DAC1 Direct Data Register, 3-20
overview, 3-16
DAQ-STC Register Group, 3-27, 4-1
DIO Register Group, 3-26
DMA Control Register Group
AI AO Select Register, 3-25
Channel A Mode Register, 3-22
Channel B Mode Register, 3-23
Channel C Mode Register, 3-24
G0 G1 Select Register, 3-26
overview, 3-21
Strobes Register, 3-21
FIFO Strobe Register Group
ADC FIFO Clear Register, 3-27
Configuration Memory Clear
Register, 3-27
DAC FIFO Clear Register, 3-27
Misc Register Group
Misc Command Register, 3-6
overview, 3-4
Serial Command Register, 3-5 to 3-6
Status Register, 3-7
register maps, 3-2 to 3-3
sizes, 3-4
windowed registers
programming considerations, 4-4
register map, 3-3
ReGlitch bit, 3-17
reglitch circuitry, 2-21
Reset_PNP_Registers function, 4-3
RTSI bus interface circuitry, 2-25 to 2-26
RTSI trigger lines, programming
considerations, 4-48 to 4-49
RTSI_BRD0 signal, 4-49
S
sample interval (SI2), 2-12
scan counter (SC), 2-12 to 2-13
scan interval (SI), 2-12
SCAN sequence
definition, 2-12
starting, 2-12
scanning, multirate. See multirate scanning.
Содержание AT-AI-16XE-10
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