Mitsubishi Electric AE1000-SW, Инструкция по эксплуатации

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E-3
■EMC Directive
In IEC60947-2, following EMC tests are required.
1) Radiated radio frequency emission
2) Radiated radio frequency electromagnetic field immunity
BIF-MD shall be installed in the panel board. It effects not only for safe against electric shock but also to interrupt
noise emission from the device. BIF-MD is confirmed to IEC60947-2 in accordance with following conditions.
●Installation
Install the device in power distribution board or control panel board that is made of conductive materials.
Power distribution board and control panel board have to be grounded to the earth with a thick wire of low
impedance.
The frame ground terminal (FG) in the device has to be grounded to the earth with a thick wire of low impedance.
(*grounded resistance: 100 ohm or less).
●Cables
Modbus cable, Internal Transmission cable shall be kept distance more than 100mm from the power distribution
circuit.
However, when parallel installation with the power distribution circuit is required, it is necessary to increase to
300mm.
■Dielectric voltage test
The dielectric voltage test should be executed according to the table below. Do not test in points other than a
following table because unit is damaged.
Measuring point Condition
Between main circuit and BIF-MD terminals (P1, P2)
2500VAC 1min.
Between main circuit and BIF-MD terminal (FG, Ter, T/R+, T/R-, COM, SLD)
Between BIF-MD terminals (P1, P2) and BIF-MD terminal (FG, Ter, T/R+, T/R-, COM, SLD)
1500VAC 1min.
Between main circuit and BIF-CON terminals (C1, C2, A1, A2, U1 and U2) 2500VAC 1min.
Between BIF-MD terminals (P1 and P2) and BIF-CON terminals (C1, C2, A1, A2, U1 and U2)
1500VAC 1min.
Between BIF-MD terminals (FG, Ter, T/R+, T/R-, COM, SLD)
and BIF-CON terminals (C1, C2, A1, A2, U1 and U2)
BIF-CON terminals (C1 and C2),
BIF-CON terminals (A1 and A2),
BIF-CON terminals (U1 and U2), each other
■Guarantee
The period of guarantee is for 1 year from the sale date except in case of the failure has been caused by bad handling of the
device.