Mikrotron EOSENS GE CAMERA, Руководство пользователя

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Technical Data EoSens GE Camera Manual
9.2 Sensor defect specifications
Parameter Description Limit
BrightPix
Amount of bright pixels (response higher then half
scale) in a dark image. Dark image must first be FPN
corrected.
< 10
DarkMeanOutput Average value of a dark image (10-bit scale). 0 < x < 235
50%MeanOutput Average value of a half scale image (10-bit scale). 390 < x < 547
FPN
Fixed pattern noise of a dark image should be smaller
than 3.1% of the signal swing
< 3.1%
TotDefects
Amount of defect pixels in a half scale image. A
defect pixel is defined as a pixel that has a response
that is 20% off the median response of all pixels. The
half scale image must be FPN corrected.
< 20
BadColumnOutput
Amount of bad columns in a half scale image. A bad
column is defined as a column that has a response
that is 10% off the median of the surrounding 40
columns. The half scale image needs to be FPN
corrected.
0
BadRow
Amount of bad rows in a half scale image. A bad row
is defined as a row that has a response that is 10%
off the median of the surrounding 40 rows. The half
scale image needs to be FPN corrected.
0
Cluster
Amount of clusters allowed
See note 1.
0
Coverglass
Dig/Scratch
Uniform illumination. Test sensor for defective pixels.
Defects on cover glass will generate defect pixels. No
defect pixels may be visible.
0
Measurement conditions:
1. Illumination source: High brightness led light source (white) Using a pinhole to imitate
the lens setup in the application. F=5.4
2. Temperature is 25ºC (logged during the test program) and 30 ºC on
wafer. Dark current limit is set at 30 ºC
3. Definition of operation conditions:
Nominal clock frequency is 310 MHz.
Unity Gain
Power supplies as specified in the datasheet (recommended operation conditions)
Integr. times:Dark image short IT: 4μs, Dark image long IT: 1s, Other images: 2ms
Note 1: A cluster is defined as a group of minimal 2 and maximum 4 neighboring defect pixels (top, bottom or
side; not diagonal). Clusters that exceed the maximum of 4 defect pixels are not allowed at all.