MI 3295 Step Contact Voltage Measuring System
Measurements
35
Notes
:
High resistance of S and H probes could influence the measurement results. In this
case the ‘Probe’ warnings are displayed.
High noise currents and voltages in earth could influence the measurement results.
The tester displays the ‘Noise’ warning in this case.
Probes must be placed at sufficient distance from the measured object.
7.4.2 Specific earth resistance measurement
Figure 7.23:
Specific earth resistance screen
Specific earth resistance measurements
Select
EARTH
function using the function selector switch.
Select
EARTH RE
sub-function using the cursor UP / DOWN keys.
Select test parameter using the cursor LEFT / RIGHT keys.
Set
distance ‘a’ using the cursor UP / DOWN keys.
Connect C1/H and C2/E test leads as current probes.
Connect S and ES test leads as potential probes.
Press the TEST key to perform the measurement.
Store the result with MEM key (optional).
Connections for specific earth resistance measurement
Figure 7.24: Example of specific earth resistance measurement result
Displayed results for earth resistance measurement:
ρ.............. Specific earth resistance,
Rp ........... Resistance of sum (S + ES) of potential probes,
Rc ........... Resistance of sum (C1/H + C2/E) of current probes.
Notes
:
High resistance of current and potential probes could influence the measurement
results. In this case the ‘Probe’ warnings are displayed.
High noise currents and voltages in earth could influence the measurement results.
The tester displays the ‘Noise’ warning in this case.
