MI 3311 GammaPAT
Single test
34
Substitute leakage measurement procedure
Select the SUB. LEAKAGE function.
Set the test parameters.
Connect device under test to the instrument (see figure 5.14).
Press the TEST key for measurement.
Store the result by pressing MEM key (optional).
Figure 1.36: Example of substitute leakage current measurement results
Displayed results:
Main result ............. Substitute leakage current
Notes:
Consider any displayed warning before starting measurement!
When S/EB1 probe is connected during the test then the current through it is also
considered.
Substitute leakage current may differ substantially from that of leakage current test
because of the way the test is performed. For example, the difference in both
leakage measurements will be affected by the presence of filter capacitors between
neutral and earth.
5.8 Substitute leakage - P
Leakage currents between live conductors and isolated accessible metal parts (screws,
handles etc.) are checked with this test. Capacitive leakage paths are included in the result
too. The test measures the current flowing at a test voltage of 30 V AC and the result is
scaled to the value of a nominal mains supply voltage.
The instrument measures the insulation resistance between:
Main test socket (L+N) and S/EB1 test terminals
This function is primarily intended for testing Class II appliances and Class II parts of Class
I appliances.
Figure 1.37: Substitute leakage - P menu
Test parameters for substitute leakage - P current measurement
OUTPUT
Test voltage [30 V]
LIMIT
Maximum current
[0.25 mA, 0.50 mA, 0.75 mA, 1.00 mA, 1.50 mA,
2.00 mA, --- mA]
TIME
Measuring time
[2 s, 3 s, 5 s, 10 s, 30 s, 60 s, 120 s, --- s]
