MI 3152(H)
Eurotest
XC (2,5 kV)
Instrument operation
39
U
0
3)
½
I
N
1)
I
N
2
I
N
5
I
N
TN / IT
120 V
t
> 800 ms
t
800 ms
t
< 150 ms
t
< 40 ms
230 V
t
> 400 ms
t
400 ms
TT
120 V
t
> 300 ms
t
300 ms
230 V
t
> 200 ms
t
200 ms
Table 4.2: Trip-out times according to IEC/HD 60364-4-41
½
I
N
1)
I
N
2
I
N
5
I
N
General RCDs
(non-delayed)
t
> 1999 ms
t
< 300 ms
t
< 150 ms
t
< 40 ms
Selective RCDs
(time-delayed)
t
> 1999 ms 130 ms < t
< 500 ms 60 ms < t
< 200 ms 50 ms < t
< 150 ms
Table 4.3: Trip-out times according to BS 7671
RCD type I
N
(mA)
½
I
N
1)
I
N
2
I
N
5
I
N
Note
t
t
t
t
I
10
> 999 ms
40 ms
40 ms
40 ms
Maximum break time
II
> 10
30
300 ms 150 ms 40 ms
III
> 30
300 ms 150 ms 40 ms
IV
S
> 30
> 999 ms
500 ms 200 ms 150 ms
130 ms 60 ms
50 ms Minimum non-actuating time
Table 4.4: Trip-out times according to AS/NZS 3017
2)
Standard
½
I
N
I
N
2
I
N
5
I
N
EN 61008 / EN 61009
300 ms
300 ms 150 ms 40 ms
IEC 60364-4-41
1000 ms 1000 ms 150 ms 40 ms
BS 7671
2000 ms 300 ms 150 ms 40 ms
AS/NZS 3017 (I, II, III)
1000 ms 1000 ms 150 ms 40 ms
Table 4.5: Maximum test times related to selected test current for general (non-delayed)
RCD
Standard
½
I
N
I
N
2
I
N
5
I
N
EN 61008 / EN 61009
500 ms
500 ms 200 ms 150 ms
IEC 60364-4-41
1000 ms 1000 ms 150 ms 40 ms
BS 7671
2000 ms 500 ms 200 ms 150 ms
AS/NZS 3017 (IV)
1000 ms 1000 ms 200 ms 150 ms
Table 4.6: Maximum test times related to selected test current for selective (time-delayed)
RCD
1)
Minimum test period for current of ½
I
N
, RCD shall not trip-out.
2)
Test current and measurement accuracy correspond to AS/NZS 3017 requirements.
3)
U
0
is nominal U
LPE
voltage.
Note
Trip-out limit times for PRCD, PRCD-K and PRCD-S are equal to General (non-delayed)
RCDs.