Linear Technology LTC2170-12, Руководство пользователя

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LTC2172-12/
LTC2171-12/LTC2170-12
3
21721012fb
converTer characTerisTics
The
l
denotes the specifications which apply over the full operating
temperature range, otherwise specifications are at T
A
= 25°C. (Note 5)
PARAMETER CONDITIONS
LTC2172-12 LTC2171-12 LTC2170-12
UNITS MIN TYP MAX MIN TYP MAX MIN TYP MAX
Resolution (No Missing Codes)
l
12 12 12 Bits
Integral Linearity Error Differential Analog Input (Note 6)
l
–1 ±0.3 1 –1 ±0.3 1 –1 ±0.3 1 LSB
Differential Linearity Error Differential Analog Input
l
–0.5 ±0.1 0.5 –0.4 ±0.1 0.4 –0.4 ±0.1 0.4 LSB
Offset Error (Note 7)
l
–12 ±3 12 –12 ±3 12 –12 ±3 12 mV
Gain Error Internal Reference
External Reference
l
–2.5
–1
–1 0.5 –2.5
–1
–1 0.5 –2.5
–1
–1 0.5
%FS
%FS
Offset Drift ±20 ±20 ±20 µV/°C
Full-Scale Drift Internal Reference
External Reference
±35
±25
±35
±25
±35
±25
ppm/°C
ppm/°C
Gain Matching External Reference ±0.2 ±0.2 ±0.2 %FS
Offset Matching ±3 ±3 ±3 mV
Transition Noise External Reference 0.32 0.32 0.32 LSB
RMS
analog inpuT
The
l
denotes the specifications which apply over the full operating temperature range, otherwise
specifications are at T
A
= 25°C. (Note 5)
SYMBOL PARAMETER CONDITIONS MIN TYP MAX UNITS
V
IN
Analog Input Range (A
IN
+
– A
IN
–
) 1.7V < V
DD
< 1.9V
l
1 to 2 V
P-P
V
IN(CM)
Analog Input Common Mode (A
IN
+
+ A
IN
–
)/2 Differential Analog Input (Note 8)
l
V
CM
– 100mV V
CM
V
CM
+ 100mV V
V
SENSE
External Voltage Reference Applied to SENSE External Reference Mode
l
0.625 1.250 1.300 V
I
IN(CM)
Analog Input Common Mode Current Per Pin, 65Msps
Per Pin, 40Msps
Per Pin, 25Msps
81
50
31
µA
µA
µA
I
IN1
Analog Input Leakage Current (No Encode) 0 < A
IN
+
, A
IN
–
< V
DD
l
–1 1 µA
I
IN2
PAR/ SER Input Leakage Current 0 < PAR/ SER < V
DD
l
–3 3 µA
I
IN3
SENSE Input Leakage Current 0.625 < SENSE < 1.3V
l
–6 6 µA
t
AP
Sample-and-Hold Acquisition Delay Time 0 ns
t
JITTER
Sample-and-Hold Acquisition Delay Jitter 0.15 ps
RMS
CMRR Analog Input Common Mode Rejection Ratio 80 dB
BW-3B Full-Power Bandwidth Figure 6 Test Circuit 800 MHz