LGE Internal Use Only
Copyright © 2007 LG Electronics. Inc. All right reserved.
Only for training and service purposes
4. TROUBLE SHOOTING
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4.17 Micro SD Trouble
TEST POINT
CIRCUIT DIAGRAM
J200
C200
U200
T-FLASH
10u
C201
5
1
STBY
VIN
3
4
VOUT
2V85_TF
U200
BH28FB1WHFV
BGND
6
GND
2
NC
R206
470K
R201
100K
R204
100K
100K
R200
R203
100K
DAT1
8
DAT2
1
DAT3
2
GND1
9
GND2
10
GND3
11
12
GND4
4
VDD
6
VSS
J200
5
CLK
3
CMD
7
DAT0
2V85_TF
C202
NA
NA
R202
100K
R205
VBAT
C200
1u
TF_DAT3
TF_DAT1
TF_DAT0
TF_CMD
TF_CLK
TFLASH_EN
TF_DAT2
Figure 4.18
Содержание MG295
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