Lexicon 200, Руководство по обслуживанию

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MPX 200 Service Manual
5-6
The (Green) LEVEL LEDs are lit to indicate when the test has Passed.
The (Red) LEVEL LEDs are lit to indicate when the test has Failed.
The following tests can be run continuously by pressing the Tap/Cancel button instead of the Load button.
Test # Test Name Diagnostic LED
7-segment
display
1 ROM Checksum COMPRESSOR “–20dB” 1
2 SRAM COMPRESSOR “–10dB” 2
3 LEXICHIP3 WCS COMPRESSOR “–3dB” 3
4 LEXICHIP3 INT COMPRESSOR “Threshold” 4
5 LEXICHIP3 ADF EFFECTS “Echo/Delay” 5
6 EEPROM EFFECTS “Gate“ 6
7 DRAM EFFECTS “Chamber” 7
8 Switch EFFECTS “Compressor” 8
9 Encoder EFFECTS “Rotry/Trmlo” 9
10 MIDI EFFECTS “Flange” 10
11 LED EFFECTS “Room” 11
When a test is run continuously a Pass/fail status will be displayed and updated on the front panel LEVEL
LEDs and the 7-segment displays each time the test is run.
Extended Diagnostic Test Desriptions
ROM Test (1)
This is the same test that resides in the POST. It was included in the Extended Diagnostics for
troubleshooting purposes.
The ROM checksum, is a byte size value that is stored in the last location of each bank. The test adds the
contents of the entire ROM including the Checksum byte. The result should equal zero (8 bit value).
Before the test is executed, the following test code will be displayed on the Diagnostic LEDs, along with the
test number on the 7-segment displays:
Test # Test Name Diagnostic LED
7-segment
display
1 ROM COMPRESSOR “–20dB” 1
Pressing the Load button will execute the test.
Pressing the Tap/Cancel button will run the test continuously.
When the test is executed, the leftmost digit of the 7-segment display will display an “r” to indicate the test is
running. The pass/fail status of the test is displayed on the 7-segment display and front panel LEVEL LEDs.
If the test passed, the (Green) LEVEL -30dB LEDs will light.
If the test failed, the (Red) LEVEL LEDs will light.
SRAM Test (2)
The SRAM Test performed during the Extended Diagnostics is a non-destructive test. The non-destructive
test will test one memory location at a time, saving the contents from the location being tested into a