N2893A Probe
N2893A 100 MHz Current Probe User’s Guide
13
- The conductor under test is positioned in such a way that it is in the center of the clamp
aperture.
At high frequencies, common mode noise may affect measurements taken on the high
voltage side of circuits. If this occurs, reduce the frequency range of the measuring
instrument or clamp onto the low-voltage side of the circuit as shown in
Figure 4
, as
appropriate.
Figure 4
Clamp Onto the Low-Voltage Side of Circuit
NOTE
Accurate measurement may be impossible in locations subject to strong external
magnetic fields, such as transformers and high-current conductors, or in locations
subject to strong external electric fields, such as radio transmission equipment.
NOTE
When performing continuous measurements, it is necessary to be aware that the zero
offset voltage will drift if the ambient temperature changes.
NOTE
At some frequencies, some sound may be produced by resonance. This has no effect
on measurements.
