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4-5
*RST
:TRIGger:SEQuence:COUNt:AUTO ON”
:SCAN <list>
:INIT
The
Þ
rst command resets the mainframe to a default
scan con
Þ
guration. The second command automatical-
ly sets the channel count to the number of channels in
the scan list, the third command de
Þ
nes the scan list,
and the fourth command takes the Model 7001 out of
the idle state.
The following program will perform a single scan
through all 40 channels of a multiplexer card installed
in slot 1:
10 OUTPUT 707; “*RST”
20 OUTPUT 707; “:trig:seq:coun:auto on”
30 OUTPUT 707; “:scan (@ 1!1!1:1!4!10)”
40 OUTPUT 707; “:init”
50 END
Line 10
Selects a default con
Þ
guration for the scan.
Line 20
Sets channel count to the scan-list-length.
Line 30
De
Þ
nes the scan list.
Line 40
Take the Model 7001 out of the idle state. The
scan is con
Þ
gured to start as soon as this
command is executed.
When the above program is run, the scan will be com-
pleted in approximately 240msec (3msec delay for each
relay close and a 3msec delay for each open), which is
too fast to view from the front panel. An additional re-
lay delay can be added to the program to slow down
the scan for viewing. The program is modi
Þ
ed by add-
ing line 25 to slow down the scan. Also, Line 5 is added
to the beginning of the program to ensure that all chan-
nels are open before the scan is started.
5
OUTPUT 707; “:open all”
10 OUTPUT 707; “*RST”
20 OUTPUT 707; “:trig:seq:coun:auto on”
25 OUTPUT 707; “:trig:del 0.25”
30 OUTPUT 707; “:scan (@ 1!1!1:1!4!10)”
40 OUTPUT 707; “:INIT”
50 END
Line 5
Opens all channels.
Line 25
Sets a 1/4 second delay after each channel
closes.
4.4
Matrix switching examples
Some applications to test thick
Þ
lm resistor networks
and transistors are provided in the following para-
graphs. These applications are intended to demon-
strate the versatility of using the matrix card in test
systems.
4.4.1 Thick film resistor network testing
A dedicated matrix system for testing thick
Þ
lm resis-
tor networks is shown in Figure 4-4. This particular
system provides two different methods to check thick
Þ
lms; four-wire resistance measurements, and voltage
measurements using an applied voltage.
The system shown in Figure 4-4 tests two 4-element
thick
Þ
lms, but can be expanded to test more by simply
using additional Model 7012 matrix cards. The Model
7001 will accommodate two matrix cards. Daisy-chain-
in six Model 7001s expands the system to 12 matrix
cards allowing 24 four-element thick
Þ
lms to be tested.
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Содержание 7012-C
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