JDS Uniphase OLP-85, Руководство пользователя

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28 OLP-85
5 P
ROBE
/PCM O
PERATION
G
ENERAL INFORMATION
5
P
ROBE
/PCM O
PERATION
General information
Dirty and/or damaged connectors are often the root cause of
optical network problems. The Probe and PCM applications
enable industry standard inspection and automated Pass/Fail
testing with report generation of optical connectors/adapters in
order to ensure industry standard fiber endface quality and
cleanliness.
For best workflow efficiency, there are two variants of fiber
microscopes available in the SmartClass™ Fiber family. The
integrated Patch Cord Microscope (PCM) which is best suited for
inspecting fiber endfaces of patch cords and the external P5000i
Digital Probe (see “Digital Analysis Microscope” on page 80 )
which may be either used for bulkhead inspection or patch cord
inspection.
The shortest inspection time is achieved when using one of the
OLP-85P models with an integrated PCM for patch cord
inspection and a P5000i Digital Probe for bulkhead inspection.
Both applications – Probe and PCM – behave essentially the
same and are described together below.
Notes: Only if a P5000i Digital Probe is connected to the
instrument is the Probe application fully functional.
Select an OLP-85P version in order to get PCM
functionality.
Patch Cord Microscope (PCM)
The PCM is a microscope used to view and inspect patch cord
(male) sides of fiber connectors.
In order to support a wide variety of fiber optic connectors the
PCM provides an exchangable FMAE adapter. The dedicated
QuickCapture key provides either instant triggering of a Pass/Fail
test or freezing the live image. For best workflow adaption the
key action is configurable. The dedicated Magnification Control
key provides fast toggling between two microscope
magnification levels, low magnification for high level inspection
of the fiber endface, and high magnification for detailed
inspection of the fiber endface.