Intel 80960SA, Руководство пользователя

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14
80960SA
2.6 ABSOLUTE MAXIMUM RATINGS*
Parameter Maximum Rating
O
perating Temperature (PLCC) ........... 0°C to +85°C Case
Operating Temperature (QFP) ............ 0°C to +100°C Case
Storage Temperature .............................. –65°C to +150°C
Voltage on Any Pin (PLCC)................. –0.5V to VCC +0.5V
Voltage on Any Pin (QFP)............... –0.25V to VCC +0.25V
Power Dissipation ....................................... 1.9W (20 MHz)
NOTICE: This is a production data sheet. The
specifications are subject to change without notice.
*WARNING: Stressing the device beyond the
“Absolute Maximum Ratings” may cause
permanent damage. These are stress ratings only.
Operation beyond the “Operating Conditions” is not
recommended and extended exposure beyond the
“Operating Conditions” may affect device reliability.
2.7 DC Characteristics
80960SA (10 and 16 MHz QFP) T
CASE
= 0°C to +100°C, V
CC
= 5V ± 5%
80960SA (10 and 16 MHz PLCC) T
CASE
= 0°C to +85°C, V
CC
= 5V ± 10%
80960SA (20 MHz PLCC) T
CASE
= 0°C to +85°C, V
CC
= 5V ± 5%
Table 5. DC Characteristics
Symbol Parameter Min Max Units Notes
V
IL
Input Low Voltage –0.3 +0.8 V
V
IH
Input High Voltage 2.0 V
CC
+ 0.3 V
V
CL
CLK2 Input Low Voltage –0.3 +0.8 V
V
CH
CLK2 Input High Voltage 0.7 V
CC
V
CC
+ 0.3 V
V
OL
Output Low Voltage 0.45
0.45
V
V
I
OL
= 4.0 mA
I
OL
= 6 mA, LOCK Pin
V
OH
Output High Voltage 2.4 V All TS, -2.5 mA (1)
I
CC
Power Supply Current:
10 MHz-QFP
10 MHz-PLCC
16 MHz-PLCC
20 MHz-PLCC 240
240
300
340 mA
mA
mA
mA T
CASE
= 0
0
C
T
CASE
= 0
0
C
T
CASE
= 0
0
C
T
CASE
= 0
0
C
I
LI1
Input Leakage Current,
Except INT0, LOCK ±15 µA 0
≤
V
IN
≤
V
CC
I
LI2
Input Leakage Current,
INT0, LOCK –300 µA V
IN
=
0.45V
(2)
I
OL
Output Leakage Current ±15 µA
C
IN
Input Capacitance 10 pF f
C
= 1 MHz (3)
C
O
Output Capacitance 12 pF f
C
= 1 MHz (3)
C
CLK
Clock Capacitance 10 pF f
C
= 1 MHz (3)
NOTES:
1. Not measured for open-drain output.
2. INT0 and LOCK have internal pullup devices.
3. Input, output and clock capacitance are not tested.