IEEE 1149.1 Test Access Port (JTAG)
MCF52277 Reference Manual, Rev. 1
33-8
Freescale Semiconductor
33.4.3.1
IDCODE Instruction
The IDCODE instruction selects the 32-bit IDCODE register for connection as a shift path between the
TDI and TDO pin. This instruction allows interrogation of the MCU to determine its version number and
other part identification data. The shift register lsb is forced to logic 1 on the rising edge of TCLK
following entry into the capture-DR state. Therefore, the first bit to be shifted out after selecting the
IDCODE register is always a logic 1. The remaining 31 bits are also forced to fixed values on the rising
edge of TCLK following entry into the capture-DR state.
IDCODE is the default instruction placed into the instruction register when the TAP resets. Thus, after a
TAP reset, the IDCODE register is selected automatically.
33.4.3.2
SAMPLE/PRELOAD Instruction
The SAMPLE/PRELOAD instruction has two functions:
•
Section 33.4.3.3, “SAMPLE Instruction,”
for description of this function.
•
PRELOAD - initialize the boundary scan register update cells before selecting EXTEST or
CLAMP. This is achieved by ignoring the data shifting out on the TDO pin and shifting in
initialization data. The update-DR state and the falling edge of TCLK can then transfer this data to
the update cells. The data is applied to the external output pins by the EXTEST or CLAMP
instruction.
33.4.3.3
SAMPLE Instruction
The SAMPLE instruction obtains a sample of the system data and control signals present at the MCU input
pins and before the boundary scan cell at the output pins. This sampling occurs on the rising edge of TCLK
in the capture-DR state when the IR contains the 0x2 opcode. The sampled data is accessible by shifting
it through the boundary scan register to the TDO output by using the shift-DR state. The data capture and
the shift operation are transparent to system operation.
EXTEST
00100
Selects boundary scan register while applying preloaded values to output
pins and asserting functional reset
ENABLE_TEST_CTRL
00110
Selects TEST_CTRL register
HIGHZ
01001
Selects bypass register while tri-stating all output pins and asserting
functional reset
CLAMP
01100
Selects bypass while applying fixed values to output pins and asserting
functional reset
BYPASS
11111
Selects bypass register for data operations
Reserved
all others
1
Decoded to select bypass register
1
Freescale reserves the right to change the decoding of the unused opcodes in the future.
Table 33-5. JTAG Instructions (continued)
Instruction
IR[4:0]
Instruction Summary
Содержание MCF52277
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