Touchscreen Controller/Analog-to-Digital Converter
MCF52277 Reference Manual, Rev. 1
22-8
Freescale Semiconductor
22.3.3
ASP Sample Timing Register (ASP_TIM)
The sample timing register provides programmable delays for different portions of the conversion
sequence.
14–12
INP
Positive input. Selects the positive input to the ADC as one of the ADC_IN[7:0] signals when the ASP is
configured for full manual operation (ASP_CR[AUTO,MODE] = 0x0).
000 ADC_IN0
001 ADC_IN1
010 ADC_IN2
011 ADC_IN3
100 ADC_IN4
101 ADC_IN5
110 ADC_IN6
111 ADC_IN7
11–9
Reserved, must be cleared.
8–0
SW
Bias switch control. Enables the touchscreen bias transistor switches when the ASP is configured for full manual
operation (ASP_CR[MODE] = 00).
0 Bias transistor off
1 Bias transistor on
Address: 0xFC0A_8008 (ASP_TIM)
Access: User read/write
31 30 29 28 27 26 25 24 23 22 21 20 19 18 17 16 15 14 13 12 11 10
9
8
7
6
5
4
3
2
1
0
R
RIDLECNT
MIDLECNT
BIACNT
SPCNT
W
Reset 0 0 0 0 0 0 0 0 0 0 0 0 1 1 1 1 0 0 0 0 1 1 1 1 1 1 1 1 1 1 1 1
Figure 22-4. ASP Sample Timing Register (ASP_TIM)
Table 22-5. ASP_TIM Field Descriptions
Field
Description
31–16
RIDLECNT
Idle time setting between two rounds of measurements when ASP_CR[AUTO] is set. When this field is cleared,
there is no idle phase between two rounds of measurements.
15–8
MIDLECNT
Idle time setting between two successive measurements. When this field is cleared, there is no idle phase
between two successive measurements. There is no idle phase between AZX/AZY and X/Y measurements.
Table 22-4. ASP_SET Field Descriptions (continued)
Field
Description
Содержание MCF52277
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